Surface Science
Scanning Probe Microscopy
X-Ray Diffraction
Nuclear Magnetic Resonance
Thin Film
Optical Characterisation
Electrical/Magnetic Characterisation
Thermal Analysis
Sample Preparation-General
Sample Preparation-Electron_Microscopy
Element Analysis
Nano Measurement
Nano Fabrication
Liquid Helium Plant
Scanning Electron Microscopy-SEM
Transmission Electron Microscopy-TEM
Material Processing
Mechanical Testing
Inspection and failure Analysis
X-Ray with CT Imaging System
Model:
cmet
Status:
Operational
Location:
4230
Description:
Max Tube Voltage:160 kV;Max.Output Power:15W;Detail detectability:<0.75µm; Spatial Resolution:1.5µm; Feature Recognition:100nm;Min Focus-object-distance:.25mm; Geometric Magnification:up to 2.000x/10.000x;Max.Inspection Area:310nnX310mm
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