Surface Science
Scanning Probe Microscopy
X-Ray Diffraction
Nuclear Magnetic Resonance
Thin Film
Optical Characterisation
Electrical/Magnetic Characterisation
Thermal Analysis
Sample Preparation-General
Sample Preparation-Electron_Microscopy
Element Analysis
Nano Measurement
Nano Fabrication
Liquid Helium Plant
Scanning Electron Microscopy-SEM
Transmission Electron Microscopy-TEM
Material Processing
Mechanical Testing
Inspection and failure Analysis
Topcon Microscope Measuring Microscope
Model:
TMM-13OZ
Status:
Operational
Location:
4230
Description:
Measuring range:X-axis/Y-axis/Z-axis: 130 x 130 x 50 mm;Minimum indication:0.001 mm;Accuracy:(3 + 2.5 L/100) mm;Eyepiece:10x, Plan acromate objective 5 X, 10 X, 20 X, 40X
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