Surface Science
Scanning Probe Microscopy
X-Ray Diffraction
Nuclear Magnetic Resonance
Thin Film
Optical Characterisation
Electrical/Magnetic Characterisation
Thermal Analysis
Sample Preparation-General
Sample Preparation-Electron_Microscopy
Element Analysis
Nano Measurement
Nano Fabrication
Liquid Helium Plant
Scanning Electron Microscopy-SEM
Transmission Electron Microscopy-TEM
Material Processing
Mechanical Testing
Inspection and failure Analysis
Scanning Acoustic Microscope (C-SAM)
Model:
C-SAM
Status:
Operational
Location:
4230
Description:
A scanning acoustic microscope (SAM) is a non-destructive imaging tool that uses focused ultrasonic waves to detect internal defects and material variations with high resolution.
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