Home
Login
Login
Forget Password
User Guide
Logout
Registration
Service & Facility
News & Info
News
MCPF Brochure
Contact Us
General Enquiries
Staff Directory
Forms
Visitor's Guide
Surface Science
Surface Analysis Kratos Axis Supra+
Surface analysis Kratos Axis Ultra
TOF SIMS V
TOF-SIMS M6
Scanning Probe Microscopy
Scanning Probe Microscope_Dimension NEXUS
Scanning Probe Microscope_Dimension ICON
X-Ray Diffraction
Multi-purpose XRD
Panalytical Empyrean MultiCore PIX3D
Powder X-ray diffractometer_PANalytical
Nuclear Magnetic Resonance
Varian NMR spectrometer
Thin Film
AJA ORION 8 -Sputtering System
Evaporation system - Explorer 14
KLA-Tencor Alpha-Step Stylus Profiler
Sputtering system-Explorer
Thin Film Sputtering System-Denton
Optical Characterisation
Bruker FTIR
Ellipsometer_Woollam
MicroRaman/Photoluminescence System
Near-field Imaging/Spectroscopy
Renishaw inVia Qontor Spectrometer System
test
UV-VIS-NIR Spectrophotometer
Electrical/Magnetic Characterisation
Cryostat
Electrochemical Analyzer
Hall effect measurement system
Resistivity/Hall Measurement System
Thermal Analysis
Discovery DSC 2500
DSC TA Q1000
Simultaneous Thermal Analyzer (STA)
TGA Q5000
TGA-5500
TGA/DTA Setaram
Thermal conductivity_Discovery
Sample Preparation-General
Band Saw_Allied
Centorr High Temp Vacuum Furnace
Diamond Saw1_4
Diamond Wheel Saw 4' II
Electric Balance
Glass Maker
Hand Polishing Equipment
High Speed Digital Camera
High Temperature Furnace
High Temperature Furnance II
Image Analysis System Q600
Mechanical Polish/Lapping Equipment III
Metallurgical Microscope and Image Analysis System Q500
Microhardness Tester
Olympus Optical Microscopy
Polisher1_8
Precision wire saw
Rotary Microtome
Sample mounting
Sieve shaker
Sliding Microtome
Vacuum oven
Wire Saw
Sample Preparation-Electron_Microscopy
Abrasive Slurry Disc Cutter
Carbon Coater
Cooling Cross Section Polisher
Dimpler grinder
Fischione Ion Miller
Gold Sputter Coater
Ion Beam Miller 691
Platinum Sputter Coater_Quorum
Ultrasonic Disk Cutter
Element Analysis
X-ray fluorescence spectrometer (XRF)
Nano Measurement
3D Surface Metrology
Contact Angle Meter
Triboindenter – Hysitron TI 980
Triboindenter Hysitron TI 900
Nano Fabrication
Desktop sputtering system
Dual Beam FIB/SEM
E-beam Evaporation System-Peva
E-beam for metal
E-beam for oxide
e-LiNE
Focused Ion Beam (II)
Optical microscope
Oven
Physical Property Measurement System
Plasma cleaner
RIE-ICP Etcher
Spin Coater and Hot Plate
UV Direct Writer
Wedge bonder (AB520)
Wedge bonder (AB550)
Liquid Helium Plant
Helial Liquefaction System
Helium Liquefier System
Scanning Electron Microscopy-SEM
Environmental SEM
JEOL-6390 SEM
JEOL-6700F SEM
JEOL-7100F SEM
JEOL-7800F SEM
JSM-IT800 SHL SEM
Transmission Electron Microscopy-TEM
Aberration Corrected TEM
JEOL 2010F TEM
Talos F200X G2 S/TEM
Material Processing
Autoclave
Centrifuge Model Velocity 18R
Furnace 1200C Nabertherm LT912B410 5
Furnace 1280C Nabertherm N11H 4
Furnace 1280C Nabertherm N11H 6
Furnace 1700C Carbolite
Furnace 1700C Carbolite Gero
Humidity Chamber
Hydraulic Hand Press
Hydraulic Vacuum and Lamination Hot Press
Memmert Oven Heating and Drying
Misonix XL2020 Sonicator
Reactive Ion Etching System (RIE)
Tube Furnace ThermConcept
Vacuum Oven Digital Temperature control
Mechanical Testing
MTS 810 Universal Testing Machine 100KN
MTS 858 Axial Torsional Machine 25KN A
MTS 858 Universal Testing Machine 15KN C
MTS 858 Universal Testing Machine 5KN B
Inspection and failure Analysis
Nikon SMZ25 Image Processing System
Particle Size Analyzer BLUEWAVE S3500
Scanning Acoustic Microscope (C-SAM)
Surface Area and Pore Size Distribution Analyzer
TecScan 7 Axis Immersion Scanner
X-Ray with CT Imaging System
Zeta Potential Nano-particle Analyzer
Reactive Ion Etching System (RIE)
Model:
RIE
Status:
Operational
Location:
4230
Description:
© The Hong Kong University of Science and Technology. All rights reserved.
Privacy Policy
