Surface Science
Scanning Probe Microscopy
X-Ray Diffraction
Nuclear Magnetic Resonance
Thin Film
Optical Characterisation
Electrical/Magnetic Characterisation
Thermal Analysis
Sample Preparation-General
Sample Preparation-Electron_Microscopy
Element Analysis
Nano Measurement
Nano Fabrication
Liquid Helium Plant
Scanning Electron Microscopy-SEM
Transmission Electron Microscopy-TEM
Material Processing
Mechanical Testing
Inspection and failure Analysis
3D Surface Metrology
Model:
Bruker NPFLEX-1000 (Bruker)
Status:
Operational
Location:
4230
Description:
The NPFLEX-1000 white light interferometry (WLI) system brings unprecedented flexibility, measurement capabilities, and performance to precision manufacturing industries aiming to understand and control manufacturing processes.
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