Surface Science
Scanning Probe Microscopy
X-Ray Diffraction
Nuclear Magnetic Resonance
Thin Film
Optical Characterisation
Electrical/Magnetic Characterisation
Thermal Analysis
Sample Preparation-General
Sample Preparation-Electron_Microscopy
Element Analysis
Nano Fabrication
Liquid Helium Plant
Scanning Electron Microscopy-SEM
Transmission Electron Microscopy-TEM
X-ray fluorescence spectrometer (XRF)
Model:
JSX-1000S (JEOL)
Status:
Maintenance
Location:
2149
Description:
The JSX-1000S is an X-ray fluorescence spectrometer offering quick, easy elemental analysis. It supports qualitative and quantitative analysis (FP method, calibration curve method) and RoHS screening.
Link:
https://www.jeol.com/products/scientific/xrf/JSX-1000S.php
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